ARTIFICIAL INTELLIGENCE FOR ENHANCED SEMICONDUCTOR MANUFACTURING: FEATURE SELECTION FOR YIELD IMPROVEMENT. International Journal of Engineering and Science Research, [S. l.], v. 14, n. 2, p. 577–591, 2024. Disponível em: https://www.ijesr.org/index.php/ijesr/article/view/736. Acesso em: 3 aug. 2025.